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1
A Reliability-aware Environment for Design Exploration for ..:
, In:
2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
,
Sierra, Robert Limas
;
Guerrero-Balaguera, Juan-David
;
Rodriguez Condia, Josie E.
. - p. 169-174 , 2023
Link:
https://doi.org/10.1109/DDECS57882.2023.10139643
RT T1 <cTitle>2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</cTitle>: T1 <Title>A Reliability-aware Environment for Design Exploration for GPU Devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10139643&Exemplar=1&LAN=DE A1 Sierra, Robert Limas A1 Guerrero-Balaguera, Juan-David A1 Rodriguez Condia, Josie E. A1 Sonza Reorda, Matteo YR 2023 SN 2473-2117 K1 Graphics processing units K1 Parallel processing K1 Reliability engineering K1 Behavioral sciences K1 Registers K1 Manufacturing K1 Circuit faults K1 Architectural models K1 Design exploration K1 Graphics Processing Units (GPUs) K1 Permanent faults K1 Reliability SP 169 OP 174 LK http://dx.doi.org/https://doi.org/10.1109/DDECS57882.2023.10139643 DO https://doi.org/10.1109/DDECS57882.2023.10139643 SF ELIB - SuUB Bremen
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