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Measurement of Interface Thermal Resistance of Micron-Thin ..:
, In:
2023 IEEE 4th International Conference on Electrical Materials and Power Equipment (ICEMPE)
,
Chen, Shijie
;
Zheng, Feihu
;
Li, Jiachen
. - p. 1-4 , 2023
Link:
https://doi.org/10.1109/ICEMPE57831.2023.10139706
RT T1
2023 IEEE 4th International Conference on Electrical Materials and Power Equipment (ICEMPE)
: T1
Measurement of Interface Thermal Resistance of Micron-Thin Film by Dielectric Transient Current Method
UL https://suche.suub.uni-bremen.de/peid=ieee-10139706&Exemplar=1&LAN=DE A1 Chen, Shijie A1 Zheng, Feihu A1 Li, Jiachen A1 Zhang, Yewen YR 2023 K1 Resistance K1 Thermal resistance K1 Current measurement K1 Nonhomogeneous media K1 Dielectric measurement K1 Dielectrics K1 Dielectric films K1 interface thermal resistance K1 dielectric transient current K1 dielectric stacking structure SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICEMPE57831.2023.10139706 DO https://doi.org/10.1109/ICEMPE57831.2023.10139706 SF ELIB - SuUB Bremen
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