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1 Ergebnisse
1
An Efficient External Memory Test Solution: Case Study for ..:
, In:
2023 IEEE 41st VLSI Test Symposium (VTS)
,
Ouyang, Keqing
;
Peng, Minqiang
;
Zhu, Yunnong
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/VTS56346.2023.10139991
RT T1
2023 IEEE 41st VLSI Test Symposium (VTS)
: T1
An Efficient External Memory Test Solution: Case Study for HPC Application
UL https://suche.suub.uni-bremen.de/peid=ieee-10139991&Exemplar=1&LAN=DE A1 Ouyang, Keqing A1 Peng, Minqiang A1 Zhu, Yunnong A1 Qi, Kang A1 Tshagharyan, Grigor A1 Kumar, Arun A1 Harutyunyan, Gurgen A1 Wang, Isaac YR 2023 SN 2375-1053 K1 High performance computing K1 Memory management K1 Random access memory K1 Focusing K1 Production K1 Built-in self-test K1 Maintenance engineering K1 External memory test K1 BIST K1 DRAM K1 HPC SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/VTS56346.2023.10139991 DO https://doi.org/10.1109/VTS56346.2023.10139991 SF ELIB - SuUB Bremen
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