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1 Ergebnisse
1
Special Session: Using Graph Neural Networks for Tier-Level..:
, In:
2023 IEEE 41st VLSI Test Symposium (VTS)
,
Hung, Shao-Chun
;
Chaudhuri, Arjun
;
Banerjee, Sanmitra
. - p. 1-4 , 2023
Link:
https://doi.org/10.1109/VTS56346.2023.10140070
RT T1
2023 IEEE 41st VLSI Test Symposium (VTS)
: T1
Special Session: Using Graph Neural Networks for Tier-Level Fault Localization in Monolithic 3D ICs *
UL https://suche.suub.uni-bremen.de/peid=ieee-10140070&Exemplar=1&LAN=DE A1 Hung, Shao-Chun A1 Chaudhuri, Arjun A1 Banerjee, Sanmitra A1 Chakrabarty, Krishnendu YR 2023 SN 2375-1053 K1 Performance evaluation K1 Location awareness K1 Degradation K1 Three-dimensional displays K1 Benchmark testing K1 Very large scale integration K1 Graph neural networks K1 Monolithic 3D integration K1 Graph neural network K1 Diagnosis SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/VTS56346.2023.10140070 DO https://doi.org/10.1109/VTS56346.2023.10140070 SF ELIB - SuUB Bremen
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