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Reduced-Order Stochastic Testing of Interconnects Subject t..:

, In: 2023 IEEE 27th Workshop on Signal and Power Integrity (SPI),
Huynen, Martijn ; Waeytens, Ruben ; Bosman, Dries... - p. 1-4 , 2023
Link: https://doi.org/10.1109/SPI57109.2023.10145572