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1 Ergebnisse
1
A Comprehensive Study on the Pillar Size of OTS-PCM Memory ..:
, In:
2023 IEEE International Memory Workshop (IMW)
,
Chien, W.C.
;
Lai, E.K.
;
Buzi, L.
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IMW56887.2023.10145816
RT T1
2023 IEEE International Memory Workshop (IMW)
: T1
A Comprehensive Study on the Pillar Size of OTS-PCM Memory with an Optimized Process and Scaling Trends Down to Sub-10 nm for SCM Applications
UL https://suche.suub.uni-bremen.de/peid=ieee-10145816&Exemplar=1&LAN=DE A1 Chien, W.C. A1 Lai, E.K. A1 Buzi, L. A1 Cheng, C.W. A1 Yeh, C.W. A1 Ray, A. A1 Gignac, L.M. A1 Gong, N. A1 Cheng, H.Y. A1 Grun, A. A1 Lee, D.Y. A1 Kim, W. A1 Majumdar, A. A1 Bishop, D. A1 Bruce, R.L. A1 Daudelin, D. A1 Ho, H.Y. A1 BrightSky, M. A1 Lung, H.L. YR 2023 SN 2573-7503 K1 Semiconductor device modeling K1 Phase change materials K1 Semiconductor device measurement K1 Voltage measurement K1 Density measurement K1 Conferences K1 Electric variables SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IMW56887.2023.10145816 DO https://doi.org/10.1109/IMW56887.2023.10145816 SF ELIB - SuUB Bremen
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