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1 Ergebnisse
1
Comprehensive Study of Endurance Fatigue in the Scaled Si F..:
, In:
2023 IEEE International Memory Workshop (IMW)
,
Shao, Xianzhou
;
Chai, Junshuai
;
Liao, Min
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IMW56887.2023.10145966
RT T1
2023 IEEE International Memory Workshop (IMW)
: T1
Comprehensive Study of Endurance Fatigue in the Scaled Si FeFET by in-situ Vth Measurement and Endurance Enhancement Strategy
UL https://suche.suub.uni-bremen.de/peid=ieee-10145966&Exemplar=1&LAN=DE A1 Shao, Xianzhou A1 Chai, Junshuai A1 Liao, Min A1 Duan, Jiahui A1 Tian, Fengbin A1 Ke, Xiaoyu A1 Sun, Xiaoqing A1 Xu, Hao A1 Xiang, Jinjuan A1 Wang, Xiaolei A1 Wang, Wenwu YR 2023 SN 2573-7503 K1 Degradation K1 Electron traps K1 Pulse measurements K1 Current measurement K1 Switches K1 Size measurement K1 Fatigue K1 Si-FeFET K1 Endurance Fatigue K1 Charge Trapping/De-trapping SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IMW56887.2023.10145966 DO https://doi.org/10.1109/IMW56887.2023.10145966 SF ELIB - SuUB Bremen
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