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1 Ergebnisse
1
Self heating and DIBL effects in 2D MoS2 based MOSFET with ..:
, In:
2022 International Conference on Information Science and Communications Technologies (ICISCT)
,
Atamuratov, A. E.
;
Saparov, X. Sh.
;
Chedjou, Jean Chamberlain
.. - p. 1-3 , 2022
Link:
https://doi.org/10.1109/ICISCT55600.2022.10146786
RT T1 <cTitle>2022 International Conference on Information Science and Communications Technologies (ICISCT)</cTitle>: T1 <Title>Self heating and DIBL effects in 2D MoS2 based MOSFET with different gate oxide and back oxide materials</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10146786&Exemplar=1&LAN=DE A1 Atamuratov, A. E. A1 Saparov, X. Sh. A1 Chedjou, Jean Chamberlain A1 Yusupov, A. A1 Kyamakya, Kyandoghere YR 2022 K1 Silicon compounds K1 Degradation K1 MOSFET K1 Thermodynamics K1 Logic gates K1 Hafnium compounds K1 Transistors K1 self-heating effect K1 DIBL effect K1 lattice temperature K1 thermal conductivity K1 two dimensional MoS2 SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/ICISCT55600.2022.10146786 DO https://doi.org/10.1109/ICISCT55600.2022.10146786 SF ELIB - SuUB Bremen
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