I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
In-Situ Extraction of the Thermal Impedance of GaN Power HE..:
, In:
2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
,
Catalano, A. P.
;
Scognamillo, C.
;
d'Alessandro, V.
. - p. 310-313 , 2023
Link:
https://doi.org/10.1109/ISPSD57135.2023.10147598
RT T1
2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
: T1
In-Situ Extraction of the Thermal Impedance of GaN Power HEMTs Embedded in PCB-based Power Circuits
UL https://suche.suub.uni-bremen.de/peid=ieee-10147598&Exemplar=1&LAN=DE A1 Catalano, A. P. A1 Scognamillo, C. A1 d'Alessandro, V. A1 Codecasa, L. YR 2023 SN 1946-0201 K1 Temperature measurement K1 Temperature sensors K1 Semiconductor device modeling K1 Semiconductor device measurement K1 HEMTs K1 Numerical models K1 Power semiconductor devices K1 electrothermal simulations K1 experimental technique K1 GaN power HEMT K1 in-situ K1 junction-to-ambient K1 thermal impedance SP 310 OP 313 LK http://dx.doi.org/https://doi.org/10.1109/ISPSD57135.2023.10147598 DO https://doi.org/10.1109/ISPSD57135.2023.10147598 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)