I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Isolated JFET Design and Performance Analyze by Experiment ..:
, In:
2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
,
Ma, Dingxiang
;
Gao, Yue
;
Hou, Dican
... - p. 254-257 , 2023
Link:
https://doi.org/10.1109/ISPSD57135.2023.10147671
RT T1 <cTitle>2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)</cTitle>: T1 <Title>Isolated JFET Design and Performance Analyze by Experiment Based on Standard 0.18µm BCD Platform</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10147671&Exemplar=1&LAN=DE A1 Ma, Dingxiang A1 Gao, Yue A1 Hou, Dican A1 Yuan, Zhangyi'an A1 Qiao, Ming A1 Zhen, Shaowei A1 Zhang, Bo YR 2023 SN 1946-0201 K1 Semiconductor device measurement K1 Voltage measurement K1 Fluctuations K1 Voltage fluctuations K1 Power measurement K1 Stability analysis K1 JFETs K1 JFET K1 standard BCD platform K1 pinch-off voltage K1 DIBL K1 process fluctuation SP 254 OP 257 LK http://dx.doi.org/https://doi.org/10.1109/ISPSD57135.2023.10147671 DO https://doi.org/10.1109/ISPSD57135.2023.10147671 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
