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1 Ergebnisse
1
Scaled-Dot Product Attention for Early Detection of At-risk..:
, In:
2022 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE)
,
Leelaluk, Sukrit
;
Minematsu, Tsubasa
;
Taniguchi, Yuta
... - p. 316-322 , 2022
Link:
https://doi.org/10.1109/TALE54877.2022.00059
RT T1
2022 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE)
: T1
Scaled-Dot Product Attention for Early Detection of At-risk Students
UL https://suche.suub.uni-bremen.de/peid=ieee-10148403&Exemplar=1&LAN=DE A1 Leelaluk, Sukrit A1 Minematsu, Tsubasa A1 Taniguchi, Yuta A1 Okubo, Fumiya A1 Yamashita, Takayoshi A1 Shimada, Atsushi YR 2022 SN 2470-6698 K1 Surveys K1 Education K1 Prediction algorithms K1 Behavioral sciences K1 prediction performance K1 early prediction K1 attention K1 machine learning K1 deep learning SP 316 OP 322 LK http://dx.doi.org/https://doi.org/10.1109/TALE54877.2022.00059 DO https://doi.org/10.1109/TALE54877.2022.00059 SF ELIB - SuUB Bremen
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