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1 Ergebnisse
1
Extraordinary Permittivity Characterization Using 4H-SiC Su..:
, In:
2023 100th ARFTG Microwave Measurement Conference (ARFTG)
,
Li, Lei
;
Reyes, Steve
;
Asadi, Mohammad Javad
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/ARFTG56062.2023.10148877
RT T1 <cTitle>2023 100th ARFTG Microwave Measurement Conference (ARFTG)</cTitle>: T1 <Title>Extraordinary Permittivity Characterization Using 4H-SiC Substrate-Integrated-Waveguide Resonators</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10148877&Exemplar=1&LAN=DE A1 Li, Lei A1 Reyes, Steve A1 Asadi, Mohammad Javad A1 Wang, Xiaopeng A1 Fabi, Gianluca A1 Ozdemir, Erdem A1 Wu, Weifeng A1 Fay, Patrick A1 Hwang, James C. M. YR 2023 K1 Microwave measurement K1 Performance evaluation K1 Silicon carbide K1 Permittivity measurement K1 Millimeter wave measurements K1 Resonant frequency K1 Resonators K1 Calibration K1 complex permittivity K1 millimeter wave K1 on-wafer measurement K1 resonators K1 substrate-integrated waveguide SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ARFTG56062.2023.10148877 DO https://doi.org/10.1109/ARFTG56062.2023.10148877 SF ELIB - SuUB Bremen
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