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1 Ergebnisse
1
Defect Detection with less training samples using Deep Neur..:
, In:
2023 2nd International Conference on Smart Technologies and Systems for Next Generation Computing (ICSTSN)
,
Pranav, Gadamsetty
;
Sonam, T
;
Sree Sharmila, T
- p. 1-4 , 2023
Link:
https://doi.org/10.1109/ICSTSN57873.2023.10151506
RT T1
2023 2nd International Conference on Smart Technologies and Systems for Next Generation Computing (ICSTSN)
: T1
Defect Detection with less training samples using Deep Neural Networks
UL https://suche.suub.uni-bremen.de/peid=ieee-10151506&Exemplar=1&LAN=DE A1 Pranav, Gadamsetty A1 Sonam, T A1 Sree Sharmila, T YR 2023 K1 Training K1 Casting K1 Visualization K1 Computational modeling K1 Neural networks K1 Inspection K1 Classification algorithms K1 casting K1 EfficientNetB7 K1 training dataset K1 ResNet50 K1 detection K1 CNN SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICSTSN57873.2023.10151506 DO https://doi.org/10.1109/ICSTSN57873.2023.10151506 SF ELIB - SuUB Bremen
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