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Evaluating a New RRAM Manufacturing Test Strategy:

, In: 2023 IEEE 24th Latin American Test Symposium (LATS),
Copetti, T. S. ; Castelnuovo, A. ; Gemmeke, T.. - p. 1-6 , 2023
Link: https://doi.org/10.1109/LATS58125.2023.10154503