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1 Ergebnisse
1
Effective and Efficient Test and Diagnosis Pattern Generati..:
, In:
2023 IEEE International 3D Systems Integration Conference (3DIC)
,
Chuang, Po-Yao
;
Lorenzelli, Francesco
;
Chakravarty, Sreejit
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/3DIC57175.2023.10154900
RT T1
2023 IEEE International 3D Systems Integration Conference (3DIC)
: T1
Effective and Efficient Test and Diagnosis Pattern Generation for Many Inter-Die Interconnects in Chiplet-Based Packages
UL https://suche.suub.uni-bremen.de/peid=ieee-10154900&Exemplar=1&LAN=DE A1 Chuang, Po-Yao A1 Lorenzelli, Francesco A1 Chakravarty, Sreejit A1 Boutobza, Slimane A1 Wu, Cheng-Wen A1 Gielen, Georges A1 Marinissen, Erik Jan YR 2023 SN 2836-4902 K1 Fault diagnosis K1 Three-dimensional displays K1 Layout K1 System integration K1 Automatic test pattern generation K1 Manufacturing K1 Through-silicon vias SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/3DIC57175.2023.10154900 DO https://doi.org/10.1109/3DIC57175.2023.10154900 SF ELIB - SuUB Bremen
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