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Study on Reliability of Long-HV-OFF-Mode of Cathode Assembl..:

, In: 2023 24th International Vacuum Electronics Conference (IVEC),
Fan, Yasong ; Zhao, Qing ; Liang, Tian... - p. 1-2 , 2023
Link: https://doi.org/10.1109/IVEC56627.2023.10157368