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1 Ergebnisse
1
Cold-Test of The W-Band Nonperiodic Concentric Arc FW-SWS B..:
, In:
2023 24th International Vacuum Electronics Conference (IVEC)
,
Wen, Zheng
;
Zhu, Fang
;
Wang, Jian
... - p. 1-2 , 2023
Link:
https://doi.org/10.1109/IVEC56627.2023.10157656
RT T1
2023 24th International Vacuum Electronics Conference (IVEC)
: T1
Cold-Test of The W-Band Nonperiodic Concentric Arc FW-SWS Based on The Beam-Wave Resynchronization Method
UL https://suche.suub.uni-bremen.de/peid=ieee-10157656&Exemplar=1&LAN=DE A1 Wen, Zheng A1 Zhu, Fang A1 Wang, Jian A1 Luo, Jirun A1 Zhang, Jun A1 He, Juntao YR 2023 K1 Scanning electron microscopy K1 Conductivity measurement K1 Conductivity K1 Surface roughness K1 Rough surfaces K1 Copper K1 Vacuum electronics K1 Cold-Test K1 Nonperiodic K1 Concentric Arc K1 Folded-Waveguide Slow-Wave Structure (FW-SWS) K1 Beam-Wave Resynchronization Method SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/IVEC56627.2023.10157656 DO https://doi.org/10.1109/IVEC56627.2023.10157656 SF ELIB - SuUB Bremen
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