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1 Ergebnisse
1
Visible-Light Insulator Defect Detection Algorithm Based on..:
, In:
2023 IEEE International Conference on Power Science and Technology (ICPST)
,
Xie, Jing
;
Du, Yaowen
;
Yu, Hong
... - p. 986-991 , 2023
Link:
https://doi.org/10.1109/ICPST56889.2023.10165005
RT T1 <cTitle>2023 IEEE International Conference on Power Science and Technology (ICPST)</cTitle>: T1 <Title>Visible-Light Insulator Defect Detection Algorithm Based on Improved YOLOv4-Tiny</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10165005&Exemplar=1&LAN=DE A1 Xie, Jing A1 Du, Yaowen A1 Yu, Hong A1 Liu, Zhijian A1 Wang, Tianyi A1 Long, Zhihong YR 2023 K1 Training K1 Target recognition K1 Transfer learning K1 Object detection K1 Insulators K1 Feature extraction K1 Data models K1 deep learning K1 insulator K1 neural network K1 lightweight K1 YOLOv4-Tiny SP 986 OP 991 LK http://dx.doi.org/https://doi.org/10.1109/ICPST56889.2023.10165005 DO https://doi.org/10.1109/ICPST56889.2023.10165005 SF ELIB - SuUB Bremen
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