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1 Ergebnisse
1
Research on ITO Conductive Glass Chipping Defect Detection ..:
, In:
2023 IEEE 3rd International Conference on Information Technology, Big Data and Artificial Intelligence (ICIBA)
,
Xiong, Jie
;
Yin, Jian
;
Liu, Jinsong
.. - p. 1379-1383 , 2023
Link:
https://doi.org/10.1109/ICIBA56860.2023.10165076
RT T1 <cTitle>2023 IEEE 3rd International Conference on Information Technology, Big Data and Artificial Intelligence (ICIBA)</cTitle>: T1 <Title>Research on ITO Conductive Glass Chipping Defect Detection Method based on Improved Skeleton Extraction</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10165076&Exemplar=1&LAN=DE A1 Xiong, Jie A1 Yin, Jian A1 Liu, Jinsong A1 Zhou, Qiujun A1 Zhang, Kun YR 2023 K1 Visualization K1 Image edge detection K1 Indium tin oxide K1 Glass K1 Manuals K1 Inspection K1 Bending K1 Machine vision K1 Chipping defect detection K1 Skeleton extraction SP 1379 OP 1383 LK http://dx.doi.org/https://doi.org/10.1109/ICIBA56860.2023.10165076 DO https://doi.org/10.1109/ICIBA56860.2023.10165076 SF ELIB - SuUB Bremen
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