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Deep-learning-based X-ray CT Slice Analysis for Layout Veri..:

, In: 2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS),
Cheng, Deruo ; Shi, Yiqiong ; Tee, Yee-Yang... - p. 1-5 , 2023
Link: https://doi.org/10.1109/AICAS57966.2023.10168608