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1 Ergebnisse
1
Three Challenges in ReRAM-Based Process-In-Memory for Neura..:
, In:
2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS)
,
Yang, Ziyi
;
Liu, Kehan
;
Duan, Yiru
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/AICAS57966.2023.10168640
RT T1
2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS)
: T1
Three Challenges in ReRAM-Based Process-In-Memory for Neural Network
UL https://suche.suub.uni-bremen.de/peid=ieee-10168640&Exemplar=1&LAN=DE A1 Yang, Ziyi A1 Liu, Kehan A1 Duan, Yiru A1 Fan, Mingjia A1 Zhang, Qiyue A1 Jin, Zhou YR 2023 SN 2834-9857 K1 Surveys K1 Program processors K1 Nonvolatile memory K1 Perturbation methods K1 Resistive RAM K1 Neural networks K1 AI accelerators K1 Process-In-Memory K1 Resistive Random Access Memory K1 AI accelerator SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/AICAS57966.2023.10168640 DO https://doi.org/10.1109/AICAS57966.2023.10168640 SF ELIB - SuUB Bremen
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