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1 Ergebnisse
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Amplification Gain of Nano-node Channel-width nMOSFETs with..:
, In:
2023 IEEE 3rd International Conference on Electronic Communications, Internet of Things and Big Data (ICEIB)
,
Lin, Yu-Chun
;
Chao, Shou-Yen
;
Chou, Ping-Chen
... - p. 64-67 , 2023
Link:
https://doi.org/10.1109/ICEIB57887.2023.10170086
RT T1
2023 IEEE 3rd International Conference on Electronic Communications, Internet of Things and Big Data (ICEIB)
: T1
Amplification Gain of Nano-node Channel-width nMOSFETs with Thermal Annealing Treatments of DPN Processes
UL https://suche.suub.uni-bremen.de/peid=ieee-10170086&Exemplar=1&LAN=DE A1 Lin, Yu-Chun A1 Chao, Shou-Yen A1 Chou, Ping-Chen A1 Cheng, Kuang-Wen A1 Zhon, Zi-Wen A1 Lan, Wen-How A1 Wang, Mu-Chun YR 2023 K1 Temperature measurement K1 Temperature sensors K1 Temperature distribution K1 MOSFET K1 Annealing K1 Process control K1 Logic gates K1 amplification K1 high-k K1 nMOSFET K1 plasma K1 thermal treatment K1 interface SP 64 OP 67 LK http://dx.doi.org/https://doi.org/10.1109/ICEIB57887.2023.10170086 DO https://doi.org/10.1109/ICEIB57887.2023.10170086 SF ELIB - SuUB Bremen
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