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1 Ergebnisse
1
Detecting JVM JIT Compiler Bugs via Exploring Two-Dimension..:
, In:
2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE)
,
Jia, Haoxiang
;
Wen, Ming
;
Xie, Zifan
... - p. 43-55 , 2023
Link:
https://doi.org/10.1109/ICSE48619.2023.00016
RT T1 <cTitle>2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE)</cTitle>: T1 <Title>Detecting JVM JIT Compiler Bugs via Exploring Two-Dimensional Input Spaces</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10172514&Exemplar=1&LAN=DE A1 Jia, Haoxiang A1 Wen, Ming A1 Xie, Zifan A1 Guo, Xiaochen A1 Wu, Rongxin A1 Sun, Maolin A1 Chen, Kang A1 Jin, Hai YR 2023 SN 1558-1225 K1 Java K1 Codes K1 Runtime K1 Computer bugs K1 Fuzzing K1 Software systems K1 Virtual machining K1 JVM K1 JIT Compiler K1 JVM Testing SP 43 OP 55 LK http://dx.doi.org/https://doi.org/10.1109/ICSE48619.2023.00016 DO https://doi.org/10.1109/ICSE48619.2023.00016 SF ELIB - SuUB Bremen
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