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1 Ergebnisse
1
Towards Formal Repair and Verification of Industry-scale De..:
, In:
2023 IEEE/ACM 45th International Conference on Software Engineering: Companion Proceedings (ICSE-Companion)
,
Munakata, Satoshi
;
Tokumoto, Susumu
;
Yamamoto, Koji
. - p. 360-364 , 2023
Link:
https://doi.org/10.1109/ICSE-Companion58688.2023.00103
RT T1 <cTitle>2023 IEEE/ACM 45th International Conference on Software Engineering: Companion Proceedings (ICSE-Companion)</cTitle>: T1 <Title>Towards Formal Repair and Verification of Industry-scale Deep Neural Networks</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10172532&Exemplar=1&LAN=DE A1 Munakata, Satoshi A1 Tokumoto, Susumu A1 Yamamoto, Koji A1 Munakata, Kazuki YR 2023 SN 2574-1934 K1 Industries K1 Quality assurance K1 Artificial neural networks K1 Maintenance engineering K1 Image restoration K1 Optimization K1 Software engineering K1 deep neural network K1 quality assurance K1 repair K1 verification K1 equivalence K1 formal method SP 360 OP 364 LK http://dx.doi.org/https://doi.org/10.1109/ICSE-Companion58688.2023.00103 DO https://doi.org/10.1109/ICSE-Companion58688.2023.00103 SF ELIB - SuUB Bremen
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