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1
An Empirical Study on Quality Issues of Deep Learning Platf..:
, In:
2023 IEEE/ACM 45th International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP)
,
Gao, Yanjie
;
Shi, Xiaoxiang
;
Lin, Haoxiang
... - p. 455-466 , 2023
Link:
https://doi.org/10.1109/ICSE-SEIP58684.2023.00052
RT T1 <cTitle>2023 IEEE/ACM 45th International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP)</cTitle>: T1 <Title>An Empirical Study on Quality Issues of Deep Learning Platform</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10172667&Exemplar=1&LAN=DE A1 Gao, Yanjie A1 Shi, Xiaoxiang A1 Lin, Haoxiang A1 Zhang, Hongyu A1 Wu, Hao A1 Li, Rui A1 Yang, Mao YR 2023 SN 2832-7659 K1 Deep learning K1 Productivity K1 Computer bugs K1 Graphics processing units K1 Maintenance engineering K1 User experience K1 Hardware K1 deep learning K1 deep learning platform K1 quality issue K1 empirical study SP 455 OP 466 LK http://dx.doi.org/https://doi.org/10.1109/ICSE-SEIP58684.2023.00052 DO https://doi.org/10.1109/ICSE-SEIP58684.2023.00052 SF ELIB - SuUB Bremen
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