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On the Effect of Instrumentation on Test Flakiness:

, In: 2023 IEEE/ACM International Conference on Automation of Software Test (AST),
Rasheed, Shawn ; Dietrich, Jens ; Tahir, Amjed - p. 123-127 , 2023
Link: https://doi.org/10.1109/AST58925.2023.00016