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1 Ergebnisse
1
Stimuli Generation for IC Design Verification using Reinfor..:
, In:
2023 IEEE European Test Symposium (ETS)
,
Tweehuysen, S.L.
;
Adriaans, G. L. A.
;
Gomony, M.
- p. 1-4 , 2023
Link:
https://doi.org/10.1109/ETS56758.2023.10174129
RT T1
2023 IEEE European Test Symposium (ETS)
: T1
Stimuli Generation for IC Design Verification using Reinforcement Learning with an Actor-Critic Model
UL https://suche.suub.uni-bremen.de/peid=ieee-10174129&Exemplar=1&LAN=DE A1 Tweehuysen, S.L. A1 Adriaans, G. L. A. A1 Gomony, M. YR 2023 SN 1558-1780 K1 Training K1 Automation K1 Europe K1 Reinforcement learning K1 Benchmark testing K1 Integrated circuit modeling SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ETS56758.2023.10174129 DO https://doi.org/10.1109/ETS56758.2023.10174129 SF ELIB - SuUB Bremen
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