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1 Ergebnisse
1
Counterfeit Detection by Semiconductor Process Technology I..:
, In:
2023 IEEE European Test Symposium (ETS)
,
Ludwig, Matthias
;
Bette, Ann-Christin
;
Lippmann, Bernhard
. - p. 1-4 , 2023
Link:
https://doi.org/10.1109/ETS56758.2023.10174131
RT T1
2023 IEEE European Test Symposium (ETS)
: T1
Counterfeit Detection by Semiconductor Process Technology Inspection
UL https://suche.suub.uni-bremen.de/peid=ieee-10174131&Exemplar=1&LAN=DE A1 Ludwig, Matthias A1 Bette, Ann-Christin A1 Lippmann, Bernhard A1 Sigl, Georg YR 2023 SN 1558-1780 K1 Industries K1 Semiconductor device measurement K1 Statistical analysis K1 Supply chains K1 Semiconductor device manufacture K1 Reliability theory K1 Safety K1 hardware K1 assurance K1 physical inspection K1 counterfeit detection K1 artificial intelligence K1 pattern recognition SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ETS56758.2023.10174131 DO https://doi.org/10.1109/ETS56758.2023.10174131 SF ELIB - SuUB Bremen
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