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1 Ergebnisse
1
Test-Point Insertion for Power-Safe Testing of Monolithic 3..:
, In:
2023 IEEE European Test Symposium (ETS)
,
Hung, Shao-Chun
;
Chaudhuri, Arjun
;
Chakrabarty, Krishnendu
- p. 1-6 , 2023
Link:
https://doi.org/10.1109/ETS56758.2023.10174135
RT T1
2023 IEEE European Test Symposium (ETS)
: T1
Test-Point Insertion for Power-Safe Testing of Monolithic 3D ICs using Reinforcement Learning*
UL https://suche.suub.uni-bremen.de/peid=ieee-10174135&Exemplar=1&LAN=DE A1 Hung, Shao-Chun A1 Chaudhuri, Arjun A1 Chakrabarty, Krishnendu YR 2023 SN 1558-1780 K1 Integrated circuits K1 Three-dimensional displays K1 Power demand K1 Simulation K1 Europe K1 Voltage K1 Switches SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ETS56758.2023.10174135 DO https://doi.org/10.1109/ETS56758.2023.10174135 SF ELIB - SuUB Bremen
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