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1 Ergebnisse
1
Automating the Generation of Functional Stress Inducing Sti..:
, In:
2023 IEEE European Test Symposium (ETS)
,
Deligiannis, Nikolaos I.
;
Faller, Tobias
;
Chenghan, Zhou
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/ETS56758.2023.10174232
RT T1
2023 IEEE European Test Symposium (ETS)
: T1
Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing
UL https://suche.suub.uni-bremen.de/peid=ieee-10174232&Exemplar=1&LAN=DE A1 Deligiannis, Nikolaos I. A1 Faller, Tobias A1 Chenghan, Zhou A1 Cantoro, Riccardo A1 Becker, Bernd A1 Reorda, Matteo Sonza YR 2023 SN 1558-1780 K1 Industries K1 Internal stresses K1 Layout K1 Switches K1 Manuals K1 Complexity theory K1 Circuit synthesis K1 Burn-In Test K1 Safety K1 Functional Test K1 Microprocessor K1 RISC-V SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ETS56758.2023.10174232 DO https://doi.org/10.1109/ETS56758.2023.10174232 SF ELIB - SuUB Bremen
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