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1 Ergebnisse
1
Exploring Next-Generation GaN Power Devices with Ferroelect..:
, In:
2023 21st International Workshop on Junction Technology (IWJT)
,
Chang, Edward-Yi
;
Wu, Jui-Sheng
;
Yang, Tsung-Ying
. - p. 1-4 , 2023
Link:
https://doi.org/10.23919/IWJT59028.2023.10175185
RT T1 <cTitle>2023 21st International Workshop on Junction Technology (IWJT)</cTitle>: T1 <Title>Exploring Next-Generation GaN Power Devices with Ferroelectric Charge Trap Gate Stack Technology for Normally-OFF Operations</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10175185&Exemplar=1&LAN=DE A1 Chang, Edward-Yi A1 Wu, Jui-Sheng A1 Yang, Tsung-Ying A1 Tsai, Chen-Hsi YR 2023 SN 2768-2153 K1 Performance evaluation K1 Electron traps K1 Renewable energy sources K1 Logic gates K1 Power electronics K1 Wide band gap semiconductors K1 Power conversion SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.23919/IWJT59028.2023.10175185 DO https://doi.org/10.23919/IWJT59028.2023.10175185 SF ELIB - SuUB Bremen
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