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1 Ergebnisse
1
Machine Learning and EMI For MOSFET Aging Diagnosis:
, In:
2023 5th Global Power, Energy and Communication Conference (GPECOM)
,
Taleb, Cheikhna Mahfoudh Ahmed
;
Slama, Jaleleddine Ben Hadj
;
Nasri, Othman
. - p. 56-62 , 2023
Link:
https://doi.org/10.1109/GPECOM58364.2023.10175792
RT T1
2023 5th Global Power, Energy and Communication Conference (GPECOM)
: T1
Machine Learning and EMI For MOSFET Aging Diagnosis
UL https://suche.suub.uni-bremen.de/peid=ieee-10175792&Exemplar=1&LAN=DE A1 Taleb, Cheikhna Mahfoudh Ahmed A1 Slama, Jaleleddine Ben Hadj A1 Nasri, Othman A1 Ndongo, Mamoudou YR 2023 SN 2832-7675 K1 Degradation K1 MOSFET K1 Machine learning algorithms K1 Buck converters K1 Computational modeling K1 Switching frequency K1 Electromagnetic interference K1 Electromagnetic Interference K1 Machine learning K1 Regression problem K1 Aging diagnosis SP 56 OP 62 LK http://dx.doi.org/https://doi.org/10.1109/GPECOM58364.2023.10175792 DO https://doi.org/10.1109/GPECOM58364.2023.10175792 SF ELIB - SuUB Bremen
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