I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Trap Dynamic Detection of GaN HEMT under Repetitive Short C..:

, In: 2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC),
Mei, Wenjuan ; Pan, Chaowu ; Liu, Zhen... - p. 1-6 , 2023
Link: https://doi.org/10.1109/I2MTC53148.2023.10176003