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1 Ergebnisse
1
Quantitative Surface Potential Measurements by AC Electrost..:
, In:
2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
,
Hackl, Thomas
;
Poik, Mathias
;
Schitter, Georg
- p. 1-5 , 2023
Link:
https://doi.org/10.1109/I2MTC53148.2023.10176066
RT T1
2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
: T1
Quantitative Surface Potential Measurements by AC Electrostatic Force Microscopy
UL https://suche.suub.uni-bremen.de/peid=ieee-10176066&Exemplar=1&LAN=DE A1 Hackl, Thomas A1 Poik, Mathias A1 Schitter, Georg YR 2023 SN 2642-2077 K1 Atomic measurements K1 Electric potential K1 Force measurement K1 Voltage measurement K1 Current measurement K1 Force K1 Electrostatic measurements K1 atomic force microscopy K1 electrostatic force microscopy K1 surface potential SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/I2MTC53148.2023.10176066 DO https://doi.org/10.1109/I2MTC53148.2023.10176066 SF ELIB - SuUB Bremen
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