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1 Ergebnisse
1
Anti tampering identification algorithm for defect measurem..:
, In:
2023 IEEE 3rd International Conference on Electronic Technology, Communication and Information (ICETCI)
,
Zhou, Qiang
;
Zhu, Li
;
Liu, Xing
.. - p. 1798-1803 , 2023
Link:
https://doi.org/10.1109/ICETCI57876.2023.10176992
RT T1 <cTitle>2023 IEEE 3rd International Conference on Electronic Technology, Communication and Information (ICETCI)</cTitle>: T1 <Title>Anti tampering identification algorithm for defect measurement data based on big data</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10176992&Exemplar=1&LAN=DE A1 Zhou, Qiang A1 Zhu, Li A1 Liu, Xing A1 Zheng, Xiuzhen A1 Fu, Yinxia YR 2023 K1 Parameter estimation K1 Service function chaining K1 Information security K1 Big Data K1 Feature extraction K1 Dynamic scheduling K1 Data models K1 cloud portfolio K1 Service function chain K1 Defect measurement data K1 Tampering K1 Encryption K1 Encoded transmission SP 1798 OP 1803 LK http://dx.doi.org/https://doi.org/10.1109/ICETCI57876.2023.10176992 DO https://doi.org/10.1109/ICETCI57876.2023.10176992 SF ELIB - SuUB Bremen
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