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Test device design and test procedure for non-destructive c..:

, In: 2023 22nd IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm),
Jois, Chetan ; Chou, Pei-En ; Prasad, Sudarshan Prasanna.. - p. 1-5 , 2023
Link: https://doi.org/10.1109/ITherm55368.2023.10177512