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1 Ergebnisse
1
Robust ESD Capability of High-voltage nLDMOSs with Embedded..:
, In:
2023 9th International Conference on Applied System Innovation (ICASI)
,
Chung, Yu-Jie
;
Chen, Shen-Li
;
Mai, Xing-Chen
.. - p. 74-76 , 2023
Link:
https://doi.org/10.1109/ICASI57738.2023.10179526
RT T1 <cTitle>2023 9th International Conference on Applied System Innovation (ICASI)</cTitle>: T1 <Title>Robust ESD Capability of High-voltage nLDMOSs with Embedded Floating P+ Structures in the Drain Side</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10179526&Exemplar=1&LAN=DE A1 Chung, Yu-Jie A1 Chen, Shen-Li A1 Mai, Xing-Chen A1 Lin, Ting-En A1 Yang, Xiu-Yuan YR 2023 SN 2768-4156 K1 Electrodes K1 Breakdown voltage K1 Technological innovation K1 Design automation K1 Modulation K1 High-voltage techniques K1 Electrostatic discharges K1 Capability K1 Floating P+ K1 N-channel LDMOS K1 Technology Computer-aided Design (TCAD) SP 74 OP 76 LK http://dx.doi.org/https://doi.org/10.1109/ICASI57738.2023.10179526 DO https://doi.org/10.1109/ICASI57738.2023.10179526 SF ELIB - SuUB Bremen
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