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1 Ergebnisse
1
ESD-capability Impacts of the RESURF NBL Length in High-vol..:
, In:
2023 9th International Conference on Applied System Innovation (ICASI)
,
Mai, Xing-Chen
;
Chen, Shen-Li
;
Lai, Jhong-Yi
.. - p. 65-67 , 2023
Link:
https://doi.org/10.1109/ICASI57738.2023.10179587
RT T1
2023 9th International Conference on Applied System Innovation (ICASI)
: T1
ESD-capability Impacts of the RESURF NBL Length in High-voltage nLDMOSs
UL https://suche.suub.uni-bremen.de/peid=ieee-10179587&Exemplar=1&LAN=DE A1 Mai, Xing-Chen A1 Chen, Shen-Li A1 Lai, Jhong-Yi A1 Liu, Zhi-Wei A1 Chung, Yu-Jie YR 2023 SN 2768-4156 K1 Technological innovation K1 Electric breakdown K1 Modulation K1 Metals K1 High-voltage techniques K1 Electrostatic discharges K1 Software K1 NBL K1 N-LDMOS K1 Silvaco T-CAD K1 Secondary breakdown current SP 65 OP 67 LK http://dx.doi.org/https://doi.org/10.1109/ICASI57738.2023.10179587 DO https://doi.org/10.1109/ICASI57738.2023.10179587 SF ELIB - SuUB Bremen
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