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In-NVRAM Unified PUF and TRNG Based on Standard CMOS Techno..:
, In:
2023 IEEE International Symposium on Circuits and Systems (ISCAS)
,
Serrano, Ronaldo
;
Sarmiento, Marco
;
Duran, Ckristian
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/ISCAS46773.2023.10181362
RT T1
2023 IEEE International Symposium on Circuits and Systems (ISCAS)
: T1
In-NVRAM Unified PUF and TRNG Based on Standard CMOS Technology
UL https://suche.suub.uni-bremen.de/peid=ieee-10181362&Exemplar=1&LAN=DE A1 Serrano, Ronaldo A1 Sarmiento, Marco A1 Duran, Ckristian A1 Dang, Tuan-Kiet A1 Hoang, Trong-Thuc A1 Pham, Cong-Kha YR 2023 SN 2158-1525 K1 Temperature sensors K1 Nonvolatile memory K1 Random access memory K1 Authentication K1 Voltage K1 Physical unclonable function K1 CMOS technology K1 NVRAM K1 PUF K1 TRNG K1 NIST K1 RoT SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ISCAS46773.2023.10181362 DO https://doi.org/10.1109/ISCAS46773.2023.10181362 SF ELIB - SuUB Bremen
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