I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Impact on Radiation Robustness of Gate Mapping in FinFET Ci..:
, In:
2023 IEEE International Symposium on Circuits and Systems (ISCAS)
,
Sandoval, Bernardo Borges
;
Brendler, Leonardo H.
;
Kastensmidt, Fernanda L.
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/ISCAS46773.2023.10181528
RT T1
2023 IEEE International Symposium on Circuits and Systems (ISCAS)
: T1
Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation
UL https://suche.suub.uni-bremen.de/peid=ieee-10181528&Exemplar=1&LAN=DE A1 Sandoval, Bernardo Borges A1 Brendler, Leonardo H. A1 Kastensmidt, Fernanda L. A1 Reis, Ricardo A1 Zimpeck, Alexandra L. A1 Schvittz, Rafael B. A1 Meinhardt, Cristina YR 2023 SN 2158-1525 K1 Single event transients K1 Radiation effects K1 Fluctuations K1 Sensitivity K1 Logic gates K1 FinFETs K1 Robustness K1 circuit robustness K1 process variability K1 single event transient K1 reliability K1 microelectronics SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ISCAS46773.2023.10181528 DO https://doi.org/10.1109/ISCAS46773.2023.10181528 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)