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1 Ergebnisse
1
Improved Toolchain-Compatible Standard Cells with 5% - 36% ..:
, In:
2023 IEEE International Symposium on Circuits and Systems (ISCAS)
,
Yadav, S.
;
Kokkeler, A.B.J
;
Alink, M.S. Oude
- p. 1-5 , 2023
Link:
https://doi.org/10.1109/ISCAS46773.2023.10181651
RT T1
2023 IEEE International Symposium on Circuits and Systems (ISCAS)
: T1
Improved Toolchain-Compatible Standard Cells with 5% - 36% Lower EDP for Super Threshold Operation in 65nm Low-Power CMOS Technology
UL https://suche.suub.uni-bremen.de/peid=ieee-10181651&Exemplar=1&LAN=DE A1 Yadav, S. A1 Kokkeler, A.B.J A1 Alink, M.S. Oude YR 2023 SN 2158-1525 K1 Performance evaluation K1 Semiconductor device modeling K1 Design standards K1 Semiconductor device manufacture K1 CMOS technology K1 Energy efficiency K1 Transistors K1 Standard Cell Optimization K1 Cell Design K1 Logic Design K1 Super-Threshold Operation K1 Leakage Power K1 Propagation Delay K1 HPSC K1 PDP K1 EDP K1 Digital K1 CMOS SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ISCAS46773.2023.10181651 DO https://doi.org/10.1109/ISCAS46773.2023.10181651 SF ELIB - SuUB Bremen
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