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An Effective Faulty TSV Detection Scheme for TSVs in High B..:

, In: 2023 IEEE International Symposium on Circuits and Systems (ISCAS),
Junsen, He ; Yoon, Dong-Hyun ; Kim, Tony Tae-Hyoung - p. 1-5 , 2023
Link: https://doi.org/10.1109/ISCAS46773.2023.10181848