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1 Ergebnisse
1
A 162nW, 0.845pJ/step Resistance-to-Digital Converter for M..:
, In:
2023 IEEE International Symposium on Circuits and Systems (ISCAS)
,
Dey, Arnab
;
Lee, Inhee
;
Ali, Ashfakh
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/ISCAS46773.2023.10181881
RT T1
2023 IEEE International Symposium on Circuits and Systems (ISCAS)
: T1
A 162nW, 0.845pJ/step Resistance-to-Digital Converter for Miniature Battery-Powered Sensing Systems
UL https://suche.suub.uni-bremen.de/peid=ieee-10181881&Exemplar=1&LAN=DE A1 Dey, Arnab A1 Lee, Inhee A1 Ali, Ashfakh A1 Jain, Arpan A1 Pullela, Abhishek A1 Abbas, Zia YR 2023 SN 2158-1525 K1 Temperature sensors K1 Resistance K1 Temperature measurement K1 Temperature dependence K1 Sensitivity K1 Voltage measurement K1 CMOS process K1 Resistance-to-digital converter K1 RDC K1 ultra-low-power K1 temperature sensitivity K1 miniature system SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ISCAS46773.2023.10181881 DO https://doi.org/10.1109/ISCAS46773.2023.10181881 SF ELIB - SuUB Bremen
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