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1
Recent Developments and Challenges in Strained Junctionless..:
, In:
2023 International Conference on Computational Intelligence and Sustainable Engineering Solutions (CISES)
,
Kumari, Amrita
;
Saini, Ashish
;
Kumar, Amit
.. - p. 118-122 , 2023
Link:
https://doi.org/10.1109/CISES58720.2023.10183417
RT T1 <cTitle>2023 International Conference on Computational Intelligence and Sustainable Engineering Solutions (CISES)</cTitle>: T1 <Title>Recent Developments and Challenges in Strained Junctionless MOSFETs: A Review</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10183417&Exemplar=1&LAN=DE A1 Kumari, Amrita A1 Saini, Ashish A1 Kumar, Amit A1 Kumar, Vivek A1 Kumar, Mukesh YR 2023 K1 Performance evaluation K1 Fabrication K1 MOSFET K1 Electronics industry K1 Logic gates K1 Threshold voltage K1 Topology K1 junctionless K1 MOSFETs K1 ON current K1 strain SP 118 OP 122 LK http://dx.doi.org/https://doi.org/10.1109/CISES58720.2023.10183417 DO https://doi.org/10.1109/CISES58720.2023.10183417 SF ELIB - SuUB Bremen
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