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1 Ergebnisse
1
Doping-Optimized Back-illuminated Single-Photon Avalanche D..:
, In:
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
,
Park, Eunsung
;
Ha, Won-Yong
;
Eom, Doyoon
... - p. 1-2 , 2023
Link:
https://doi.org/10.23919/VLSITechnologyandCir57934.202..
RT T1 <cTitle>2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>Doping-Optimized Back-illuminated Single-Photon Avalanche Diode in Stacked 40 nm CIS Technology Achieving 60% PDP at 905 nm</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10185229&Exemplar=1&LAN=DE A1 Park, Eunsung A1 Ha, Won-Yong A1 Eom, Doyoon A1 Ahn, Dae-Hwan A1 An, Hyuk A1 Yi, Suhyun A1 Kim, Kyung-Do A1 Kim, Jongchae A1 Choi, Woo-Young A1 Lee, Myung-Jae YR 2023 SN 2158-9682 K1 Temperature measurement K1 Timing jitter K1 Breakdown voltage K1 Voltage measurement K1 Three-dimensional displays K1 Wavelength measurement K1 Simulation SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185229 DO https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185229 SF ELIB - SuUB Bremen
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