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1 Ergebnisse
1
Highly Reliable and Manufacturable MRAM embedded in 14nm Fi..:
, In:
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
,
Ko, S.
;
Park, J. H.
;
Bak, J. H.
... - p. 1-2 , 2023
Link:
https://doi.org/10.23919/VLSITechnologyandCir57934.202..
RT T1 <cTitle>2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>Highly Reliable and Manufacturable MRAM embedded in 14nm FinFET node</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10185248&Exemplar=1&LAN=DE A1 Ko, S. A1 Park, J. H. A1 Bak, J. H. A1 Jung, H. A1 Shim, J. A1 Kim, D. S. A1 Lim, W. A1 Jeong, D.-E. A1 Lee, J. H. A1 Lee, K. A1 Park, J.-H. A1 Kim, Y. A1 Kim, C. A1 Jeong, J. H. A1 Lee, C. Y. A1 Han, S. H. A1 Ji, Y. A1 Hwang, S. H. A1 Shin, H. J. A1 Lee, K. A1 Song, Y. J. A1 Shin, Y. G. A1 Song, J. H. YR 2023 SN 2158-9682 K1 Temperature distribution K1 Automotive applications K1 Random access memory K1 Very large scale integration K1 FinFETs K1 Distance measurement K1 Reliability K1 eMRAM K1 MTJ K1 14nm FinFET and Patterning SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185248 DO https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185248 SF ELIB - SuUB Bremen
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