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1 Ergebnisse
1
Demonstration of crystalline IGZO transistor with high ther..:
, In:
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
,
Kim, Whayoung
;
Kim, Jaehyeon
;
Ko, Dongjin
... - p. 1-2 , 2023
Link:
https://doi.org/10.23919/VLSITechnologyandCir57934.202..
RT T1 <cTitle>2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>Demonstration of crystalline IGZO transistor with high thermal stability for memory applications</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10185258&Exemplar=1&LAN=DE A1 Kim, Whayoung A1 Kim, Jaehyeon A1 Ko, Dongjin A1 Cha, Jun-Hwe A1 Park, Gyeongcheol A1 Ahn, Youngbae A1 Lee, Jong-Young A1 Sung, Minchul A1 Choi, Hyejung A1 Ryu, Seung Wook A1 Kim, Seiyon A1 Na, Myunghee A1 Cha, Seonyong YR 2023 SN 2158-9682 K1 Performance evaluation K1 Resistance K1 X-ray scattering K1 Very large scale integration K1 Logic gates K1 Zinc oxide K1 Threshold voltage K1 oxide semiconductor K1 indium gallium zinc oxide K1 crystalline IGZO K1 thin-film transistors and thermal stability SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185258 DO https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185258 SF ELIB - SuUB Bremen
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