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1 Ergebnisse
1
A 28 nm 66.8 TOPS/W Sparsity-Aware Dynamic-Precision Deep-L..:
, In:
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
,
Mun, HanGyeol
;
Son, Hyunwoo
;
Moon, Seunghyun
... - p. 1-2 , 2023
Link:
https://doi.org/10.23919/VLSITechnologyandCir57934.202..
RT T1 <cTitle>2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>A 28 nm 66.8 TOPS/W Sparsity-Aware Dynamic-Precision Deep-Learning Processor</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10185264&Exemplar=1&LAN=DE A1 Mun, HanGyeol A1 Son, Hyunwoo A1 Moon, Seunghyun A1 Park, Jaehyun A1 Kim, ByungJun A1 Sim, Jae-Yoon YR 2023 SN 2158-9682 K1 Semiconductor device modeling K1 Adaptation models K1 Computational modeling K1 Artificial neural networks K1 Very large scale integration K1 Transformers K1 Energy efficiency SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185264 DO https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185264 SF ELIB - SuUB Bremen
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