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1 Ergebnisse
1
Determining the low-frequency noise source in cryogenic ope..:
, In:
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
,
Inaba, Takumi
;
Oka, Hiroshi
;
Asai, Hidehiro
... - p. 1-2 , 2023
Link:
https://doi.org/10.23919/VLSITechnologyandCir57934.202..
RT T1 <cTitle>2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>Determining the low-frequency noise source in cryogenic operation of short-channel bulk MOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10185298&Exemplar=1&LAN=DE A1 Inaba, Takumi A1 Oka, Hiroshi A1 Asai, Hidehiro A1 Fuketa, Hiroshi A1 Iizuka, Shota A1 Kato, Kimihiko A1 Shitakata, Shunsuke A1 Fukuda, Koichi A1 Mori, Takahiro YR 2023 SN 2158-9682 K1 Temperature distribution K1 MOSFET K1 Fermi level K1 Qubit K1 Cryogenics K1 Very large scale integration K1 Silicon SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185298 DO https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185298 SF ELIB - SuUB Bremen
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