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A 320 x 320 1/5" BSI-CMOS stacked event sensor for low-powe..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),

Schon, Guillaume ; Bourke, Denis ; Doisneau, Pierre-Antoine... - p. 1-2 , 2023

Link: https://doi.org/10.23919/VLSITechnologyandCir57934.202..

RT 
T1 <cTitle>2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>A 320 x 320 1/5" BSI-CMOS stacked event sensor for low-power vision applications</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-10185354&Exemplar=1&LAN=DE
				
A1 Schon, Guillaume
A1 Bourke, Denis
A1 Doisneau, Pierre-Antoine
A1 Finateu, Thomas
A1 Gonzalez, Adrien
A1 Hanajima, Naoyuki
A1 Hitana, Tahar
A1 Vuuren, Lucas Janse Van
A1 Kadry, Moataz
A1 Laurent, Charles
A1 Goff, Florian Le
A1 Matolin, Daniel
A1 Mezaour, Adel
A1 Michel, Benoit
A1 Naguleswaran, Thulaxan
A1 Opperman, Tjaart
A1 Perrin, Patrice
A1 Reynaud, Etienne
A1 Shahrokhi, Farzaneh
A1 Tahachouite, Hiba
A1 Tianfan, Chen
A1 Branden, Gerd Van Den
A1 Ziram, Akli
A1 Jaffard, Jean-Luc
A1 Posch, Christoph
YR 2023
SN 2158-9682
K1 Filtering
K1 Very large scale integration
K1 Vision sensors
K1 Event-based vision
K1 event sensor
K1 3D stacking
K1 CIS
SP 1
OP 2
LK http://dx.doi.org/https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185354
DO https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185354
SF ELIB - SuUB Bremen

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